¥ 2246
Rolf Isermann, TU Darmstadt, Darmstadt, Germany / 2016-09-24 / Springer Berlin Heidelberg
¥ 1084
Vasyl Harik, Nanodesigns Consulting, Wilmington, DE, USA / 2016-09-22 / Springer Berlin Heidelberg
¥ 1102
Dieter Schramm, Universität Duisburg-Essen, Duisburg, Germany; Manfred Hiller, Universität Duisburg-Essen, Duisburg, Germany; Roberto Bardini, München, Germany / 2016-09-17 / Springer Berlin Heidelberg
¥ 1678
Massimo Guiggiani, Università di Pisa, Pisa, Italy / 2016-09-17 / Springer Berlin Heidelberg
¥ 2420
Jan Fischer-Wolfarth, VDI/VDE Innovation + Technik GmbH, Berlin, Germany; Gereon Meyer, VDI/VDE Innovation + Technik GmbH, Berlin, Germany / 2016-09-17 / Springer Berlin Heidelberg
¥ 1211
Sun / 2016-09-15 / Springer International Publishing
¥ 1036
Milan Jani, Delft University of Technology, Delft, The Netherlands / 2016-08-27 / Springer Berlin Heidelberg
¥ 2358
Liebl / 2016-08-26 / Vieweg+Teubner / Springer Fachmedien Wiesbaden
¥ 744
Jörg Schäuffele, Erligheim; Thomas Zurawka, Stuttgart / 2016-08-24 / Vieweg+Teubner / Springer Fachmedien Wiesbaden
¥ 1084
Thomas Helmer, Technische Universität Berlin, Berlin, Germany / 2016-08-23 / Springer Berlin Heidelberg
¥ 1125
Quansheng Zhang, The Ohio State University, Columbus, OH, USA; Shengbo Eben Li, Tsinghua University, State Key Lab of Automotive Safety and Energy, Beijing, China; Kun Deng, University of Illinois at  / 2016-08-19 / Springer International Publishing
¥ 1311
Cornel Stan, West Saxon University, Zwickau, Germany / 2016-08-16 / Springer Berlin Heidelberg
¥ 998
Patricia Egede, TU Braunschweig Inst. of Machine Tools and Prod. Techn., Braunschweig, Germany / 2016-08-02 / Springer Berlin Heidelberg
¥ 2001
Rowe, Jason / 2016-08-01 / Woodhead Publishing
¥ 2300
Luque, Rafael / 2016-08-01 / Woodhead Publishing
¥ 1424
Bonnick, Alan / 2016-07-26 / Routledge
¥ 1508
ITE / 2016-07-22 / Wiley
¥ 537
Duffy, James E. / 2016-07-18 / Goodheart-Wilcox Publisher
¥ 884
Meyer, Gereon;Beiker, Sven / 2016-07-15 / Springer International Publishing
¥ 2312
Manfred Harrer, Weissach, Germany; Peter Pfeffer, Munich University of Applied Science, Munich, Germany / 2016-07-06 / Springer Berlin Heidelberg
¥ 271
Mike Forsythe / 2016-07-01 / Haynes Publishing
¥ 264
John Haynes / 2016-07-01 / Haynes Publishing
¥ 272
John Haynes / 2016-07-01 / Haynes Publishing
¥ 274
John Haynes / 2016-07-01 / Haynes Publishing
¥ 217
 / 2016-07-01 / Haynes Publishing
¥ 270
John Haynes / 2016-07-01 / Haynes Publishing
¥ 263
 / 2016-07-01 / Haynes Publishing
¥ 268
 / 2016-07-01 / Haynes Publishing
¥ 267
 / 2016-07-01 / Haynes Publishing
¥ 275
Editors of Haynes Manuals / 2016-07-01 / Haynes Publishing
¥ 267
Ken Layne / 2016-07-01 / Haynes Publishing
¥ 267
John H Haynes^^J J Haynes / 2016-07-01 / Haynes Publishing
¥ 270
Tim Imhoff / 2016-07-01 / Haynes Publishing
¥ 267
Jay Storer / 2016-07-01 / Haynes Publishing
¥ 271
John H Haynes / 2016-07-01 / Haynes Publishing
¥ 268
Ken Freund / 2016-07-01 / Haynes Publishing
¥ 267
John Haynes / 2016-07-01 / Haynes Publishing
¥ 270
 / 2016-07-01 / Haynes Publishing
¥ 267
Alan Harold Ahlstrand / 2016-07-01 / Haynes Publishing
¥ 265
John H Haynes^^John Haynes / 2016-07-01 / Haynes Publishing
¥ 287
Mike Forsythe / 2016-07-01 / Haynes Publishing
¥ 271
Ken Freund / 2016-07-01 / Haynes Publishing
¥ 267
Editors of Haynes Manuals / 2016-07-01 / Haynes Publishing
¥ 274
Haynes Publishing / 2016-07-01 / Haynes Publishing
¥ 267
John A Wegmann^^Ken Freund / 2016-07-01 / Haynes Publishing
¥ 271
John H Haynes^^John Haynes / 2016-07-01 / Haynes Publishing
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