Atomic Force Microscopy for Energy Research(Emerging Materials and Technologies)

用于能源研究的原子力显微镜

材料科学基础学科

售   价:
1642.00
发货周期:预计5-7周发货
作      者
出  版 社
出版时间
2022年04月27日
装      帧
精装
ISBN
9781032004075
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页      码
456
开      本
234 x 156 mm (6.14 x 9.21
语      种
英文
综合评分
5 分
我 要 买
- +
库存 28 本
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图书简介
Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed. FEATURES First book to focus on application of AFM for energy research Details the use of advanced AFM and addresses many types of functional AFM tools Enables readers to operate an AFM instrument successfully and to understand the data obtained Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.
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