图书简介
This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples.Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader’s purpose.
Acoustic Microscopy.- Action Spectroscopy with STM.- Ambient Pressure X-ray Photoelectron Spectroscopy.- Angle-resolved Ultraviolet Photoelectron Spectroscopy.- Atom Probe Field Ion Microscope.- Atomic Force Microscope.- Auger electron spectroscopy.- Cathodoluminescence.- Conductive Atomic Force Microscopy.- Differential Interference Contrast Microscopy/Phase-Contrast Microscopy.- Dynamic Secondary Ion Mass Spectrometry.- Elastic Recoil Detection Analysis.- Electrochemical Atomic Force Microscopy.- Electrochemical Infrared Spectroscopy.- Electrochemical Scanning Tunneling Microscopy.- Electrochemical Second Harmonic Generation.- Electrochemical Sum Frequency Generation.- Electrochemical Surface X-ray Scattering.- Electrochemical Transmission Electron Microscopy.- Electrochemical X-ray Absorption Fine Structure.- Electrochemical X-ray Photoelectron Spectroscopy.- Electron Backscatter Diffraction.- Electron Energy Loss Spectroscopy.- Electron Probe Microanalysis.- Electron Stimulated Desorption.- Electron-beam-induced current.- Ellipsometry.- Environmental SEM (Atmospheric SEM).- Environmental Transmission Electron Microscopy.- Extended X-ray Absorption Fine Structure.- Focused Ion Beam Scanning Electron Microscope.- Force Curve.- Force Spectroscopy.- Frequency-Modulation Atomic Force Microscopy.- Gap Mode Raman Spectroscopy.- Glow Discharge Mass Spectrometry.- Glow Discharge Optical Emission Spectrometry.- Hard X-ray Photoelectron Spectroscopy.- Helium Atom Scattering.- High-resolution Elastic Recoil Detection Analysis.- High-resolution electron energy loss spectroscopy.- High-resolution Rutherford Backscattering Spectrometry.- High-Speed Atomic Force Microscopy.- Imaging Ellipsometry.- Impact Collision Ion Scattering Spectroscopy.- Inelastic Electron Tunneling Spectroscopy.- Infrared External-Reflection Spectroscopy.- Infrared Reflection Absorption Spectroscopy.- Interferometer displacement measurement.- Inverse Photoemission Spectroscopy.- Kelvin Probe Force Microscope.- Laser Ionization Secondary Neutral Mass Spectrometry.- Laser Photoelectron Spectroscopy.- Lateral Force Microscopy.- Liquid SPM/AFM.- Low Energy Ion Scattering Spectroscopy.- Low-Energy Electron Diffraction.- Low-Energy Electron Microscope.- Magnetic Force Microscopy.- Matrix-Assisted Laser Desorption/Ionization.- Medium Energy Ion Scattering.- Micro Raman Spectroscopy.- Microprobe Reflection High Energy Electron Diffraction.- Multiple-probe Scanning Probe Microscope.- Nanoscale Angle-resolved Photoelectron Spectroscopy.- Nonlinear Spectroscopy.- Nuclear Reaction Analysis.- Optical Microscopy.- Optical second harmonic generation spectroscopy and microscopy.- Particle Induced X-ray Emission.- Penning Ionization Electron Spectroscopy.- Phase Mode SPM/AFM.- Photoelectron diffraction.- Photoelectron holography.- Photoelectron Yield Spectroscopy.- Photoemission Electron Microscope.- Photoluminescence.- Photon Emission from the Scanning Tunneling Microscope.- Photo-Stimulated Desorption.- Piezoresponse Force Microscope.- Positron-Annihilation-Induced Desorption.- p-Polarized Multiple-Angle Incidence Resolution Spectrometry.- Quartz Crystal Microbalance.- Reflectance Difference Spectroscopy.- Reflection High-Energy Electron Diffraction.- Resonant Inelastic X-ray Scattering.- Rutherford Backscattering Spectrometry.- Scanning Capacitance Microscopy.- Scanning Electrochemical Microscopy.- Scanning Electron Microscope Energy Dispersive X-ray Spectrometry.- Scanning Electron Microscopy.- Scanning Helium Ion Microscope.- Scanning Near-field Optical Microscopy/ Near-field Scanning Optical Microscopy.- Scanning Probe Microscopy.- Scanning Transmission Electron Microscopy.- Scanning Transmission X-ray Microscopy.- Scanning Tunneling Microscopy.- Scanning Tunneling Spectroscopy.- Soft X-ray Absorption Fine Structure.- Spectroscopic Ellipsometry.- Spin- and Angle-resolve
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