Springer Handbook of Microscopy

图书简介

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology.Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy.In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, theSpringer Handbook of Microscopyis a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Part A: Electron and Ion Microscopy.- Kirkland et al.: Atomic Resolution Transmission Electron Microscopy.- Nellist: Scanning Transmission Electron Microscopy.- Ross & Minor: In situ Transmission Electron Microscopy.- Plitzko & Baumeister: Crytoelectron TEM.- Erdmann et al: Scanning Electron Microscopy.- Thiel: Variable Pressure Scanning Electron Microscopy.- Botton, Pradhudev: Analytical Electron Microscopy.- Campbell et al: High-Speed Electron Microscopy.- Bauer: LEEM, SPLEEM and SPELEEM.- Feng & Scholl: Photoemission Electron Microscopy.- Tromp: Spectroscopy with the Low Energy Electron Microscope.- Van Aert: Model-Based Electron Microscopy.- Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer.- Hlawacek: Ion Microscopy.-Kelly: Atom-Probe Tomography.-Part B: Holography, Ptychography and Diffraction.-Dunin-Borkowski et al.: Electron Holography.-Rodenburg & Maiden: Ptychography.- Zuo: Electron Nanodiffraction.- Musumeci & Li: High-Energy Time-Resolved Electron Diffraction.- Spence: Diffractive Imaging of Single Particles.-Part C: Photon-based Microscopy.- Diaspro et al: Fluorescence Microscopy.- Sahl et al.: Far-Field Fluorescence Microscopy.- Jacobson et al: Zone-Plate X-Ray Microscopy.- Lin et al: Microcomputed Tomography.-Part D: Applied Microscopy.-Huey et al: Scanning Probe Microscopy in Materials Science.- Leary & Midgeley: Electron Tomography in Materials Science.- Sutter: Scanning Tunneling Microscopy in Surface Science.- Hamidian et al: Visualizing electronic quantum matter.- Ma et al (Terasaki): Microscopy of Nanoporous Crystals.- Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography.- Amrein & Stamov: Atomic Force Microscopy in the Life Sciences.- Jones: Microscopy in Forensic Sciences.

Trade Policy 买家须知

关于产品：
● 正版保障：本网站隶属于中国国际图书贸易集团公司，确保所有图书都是100%正版。
● 环保纸张：进口图书大多使用的都是环保轻型张，颜色偏黄，重量比较轻。
● 毛边版：即书翻页的地方，故意做成了参差不齐的样子，一般为精装版，更具收藏价值。
关于退换货：
由于预订产品的特殊性，采购订单正式发订后，买方不得无故取消全部或部分产品的订购。
由于进口图书的特殊性，发生以下情况的，请直接拒收货物，由快递返回：
● 外包装破损/发错货/少发货/图书外观破损/图书配件不全（例如：光盘等）
并请在工作日通过电话400-008-1110联系我们。
签收后，如发生以下情况，请在签收后的5个工作日内联系客服办理退换货：
● 缺页/错页/错印/脱线
关于发货时间：
一般情况下：
●【现货】下单后48小时内由北京（库房）发出快递。
●【预订】【预售】下单后国外发货，到货时间预计5-8周左右，店铺默认中通快递，如需顺丰快递邮费到付。
● 需要开具发票的客户，发货时间可能在上述基础上再延后1-2个工作日（紧急发票需求，请联系010-68433105/3213）；
● 如遇其他特殊原因，对发货时间有影响的，我们会第一时间在网站公告，敬请留意。
关于到货时间：
由于进口图书入境入库后，都是委托第三方快递发货，所以我们只能保证在规定时间内发出，但无法为您保证确切的到货时间。
● 主要城市一般2-4天
● 偏远地区一般4-7天
关于接听咨询电话的时间：
010-68433105/3213正常接听咨询电话的时间为：周一至周五上午8：30～下午5：00，周六、日及法定节假日休息，将无法接听来电，敬请谅解。
其它时间您也可以通过邮件联系我们：customer@readgo.cn,工作日会优先处理。
关于快递：
● 已付款订单：主要由中通、宅急送负责派送，订单进度查询请拨打010-68433105/3213。

Springer Handbook of Microscopy（Springer Handbooks） 材料科学基础学科

Springer Handbook of Microscopy（Springer Handbooks）
材料科学基础学科