Kelvin Probe Force Microscopy:From Single Charge Detection to Device Characterization（Springer Series in Surface Sciences）
开尔文探针力显微镜：从单电荷检测到器件表征
分析化学售 价：
￥
1470.00
发货周期：外国库房发货，通常付款后3-5周到货
出版时间
2019年01月04日
装 帧
平装
页 码
521
开 本
235*155mm
语 种
英文
综合评分
暂无评分
- 图书详情
- 目次
- 买家须知
- 书评（0）
- 权威书评（0）
图书简介
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
本书暂无推荐
本书暂无推荐
看了又看
- 上一个
