VLSI Design and Test:22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers(Communications in Computer and Information Science)

计算机科学技术基础学科

原   价:
2842.00
售   价:
1421.00
优惠
平台大促 低至8折优惠
发货周期:外国库房发货,通常付款后3-5周到货
出  版 社
出版时间
2019年01月25日
装      帧
ISBN
9789811359491
复制
页      码
722
语      种
英文
版      次
2019
综合评分
暂无评分
我 要 买
- +
库存 50 本
  • 图书详情
  • 目次
  • 买家须知
  • 书评(0)
  • 权威书评(0)
图书简介
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
本书暂无推荐
本书暂无推荐
看了又看
  • 上一个
  • 下一个