Theoretical Concepts of X-Ray Nanoscale Analysis:Theory and Applications(Springer Series in Materials Science)

材料科学基础学科

原   价:
2096.00
售   价:
1677.00
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发货周期:外国库房发货,通常付款后3-5周到货
出  版 社
出版时间
2016年08月27日
装      帧
平装
ISBN
9783662520543
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页      码
318
开      本
9.21 x 6.14 x 0.70
语      种
英文
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图书简介
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
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