Kelvin Probe Force Microscopy:Measuring and Compensating Electrostatic Forces(Springer Series in Surface Sciences)

材料科学基础学科

原   价:
1865.00
售   价:
1492.00
优惠
平台大促 低至8折优惠
发货周期:外国库房发货,通常付款后3-5周到货
作      者
出  版 社
出版时间
2013年11月30日
装      帧
平装
ISBN
9783642271137
复制
页      码
334
开      本
9.21 x 6.14 x 0.72
语      种
英文
综合评分
暂无评分
我 要 买
- +
库存 50 本
  • 图书详情
  • 目次
  • 买家须知
  • 书评(0)
  • 权威书评(0)
图书简介
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
本书暂无推荐
本书暂无推荐
看了又看
  • 上一个
  • 下一个