Scanning Probe Microscopy:Electrical and Electromechanical Phenomena at the Nanoscale

机械史

原   价:
3315
售   价:
2652.00
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平台大促 低至8折优惠
发货周期:预计8-10周发货
出  版 社
出版时间
2016年11月04日
装      帧
平装
ISBN
9781493950362
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页      码
980
语      种
英文
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图书简介
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
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