Scanning Probe Microscopy:Electrical and Electromechanical Phenomena at the Nanoscale

Scanning Probe Microscopy:Electrical and Electromechanical Phenomena at the Nanoscale
机械史

原价：

￥ 3315

售价：

优惠

平台大促低至8折优惠

发货周期：预计8-10周发货

作者

Sergei V. Kalinin, Oak Ridge National Laboratory, Oak Ridge, TN, USA; Alexei Gruverman, University of Nebraska - Lincoln Dept. Materials Science and Engineering, Lincoln, NE, USA

出版社

Springer New York

出版时间

2016年11月04日

装帧

平装

ＩＳＢＮ

9781493950362

复制

页码

980

语种

英文

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暂无评分

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图书简介

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

SPM Techniques for Electrical Characterization.- Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport.- Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy.- Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics.- Principles of Kelvin Probe Force Microscopy.- Frequency-Dependent Transport Imaging by Scanning Probe Microscopy.- Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy.- Principles of Near-Field Microwave Microscopy.- Electromagnetic Singularities and Resonances in Near-Field Optical Probes.- Electrochemical SPM.- Near-Field High-Frequency Probing.- Electrical and Electromechanical Imaging at the Limits of Resolution.- Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors.- Spin-Polarized Scanning Tunneling Microscopy.- Scanning Probe Measurements of Electron Transport in Molecules.- Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices.- Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks.- Theory of Scanning Probe Microscopy.- Multi-Probe Scanning Tunneling Microscopy.- Dynamic Force Microscopy and Spectroscopy in Vacuum.- Scanning Tunneling Microscopy and Spectroscopy of Manganites.- Electrical SPM Characterization of Materials and Devices.- Scanning Voltage Microscopy.- Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces.- Electromechanical Behavior in Biological Systems at the Nanoscale.- Scanning Capacitance Microscopy.- Kelvin Probe Force Microscopy of Semiconductors.- Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy.- Electron Flow Through Molecular Structures.- Electrical Characterization of Perovskite Nanostructures by SPM.- SPM Measurements of Electric Properties of Organic Molecules.- High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices.- Electrical Nanofabrication.- Electrical SPM-Based Nanofabrication Techniques.- Fundamental Science and Lithographic Applications of Scanning Probe Oxidation.- UHV-STM Nanofabrication on Silicon.- Ferroelectric Lithography.- Patterned Self-Assembled Monolayers via Scanning Probe Lithography.- Resistive Probe Storage: Read/Write Mechanism.

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