Ion Beam Analysis:Fundamentals and Applications

材料科学基础学科

原   价:
2328.00
售   价:
1862.00
优惠
平台大促 低至8折优惠
发货周期:预计5-7周发货
出  版 社
出版时间
2014年08月27日
装      帧
ISBN
9781439846384
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页      码
472
开      本
6-1/8x9-1/4
语      种
英文
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图书简介
This book explains the basic characteristics of ion beams as applied to the analysis of materials, as well as IBA of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. It starts with coverage of the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induced x-ray emission, and nuclear reaction analysis. The second part turns to applications, looking at the broad range of potential uses in thin film reactions, ion implantation, nuclear energy, biology, and art/archaeology.
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