X-Ray Diffraction:Modern Experimental Techniques

X射线衍射:现代实验技术

电子技术

原   价:
1575.00
售   价:
1260.00
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平台大促 低至8折优惠
发货周期:预计5-7周发货
作      者
出  版 社
出版时间
2015年02月10日
装      帧
精装
ISBN
9789814303590
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页      码
414
开      本
6x9
语      种
英文
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图书简介
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
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