Cluster Secondary Ion Mass Spectrometry:Principles and Applications(Wiley Series on Mass Spectrometry)

集群二次离子质谱法:原理与应用

分析化学

售   价:
1107.00
发货周期:预计3-5周发货
作      者
出  版 社
出版时间
2013年05月14日
装      帧
精装
ISBN
9780470886052
复制
页      码
368
语      种
英文
综合评分
暂无评分
我 要 买
- +
库存 29 本
  • 图书详情
  • 目次
  • 买家须知
  • 书评(0)
  • 权威书评(0)
图书简介
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.
馆藏图书馆
Harvard Library
Yale University Library
Princeton University Library
本书暂无推荐
本书暂无推荐
看了又看
  • 上一个
  • 下一个