Advances and Challenges in Chemical Mechanical Planarization

化学机械平面化的进展和挑战

材料表面与界面

原   价:
450.00
售   价:
360.00
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平台大促 低至8折优惠
发货周期:预计5-7周发货
出  版 社
出版时间
2014年06月15日
装      帧
平装
ISBN
9781107408708
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页      码
388
语      种
英语
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图书简介
Chemical mechanical planarization (CMP) has been a leading-edge technology in semiconductor processing for the past 15−20 years. A successful CMP process is based in fundamental science across the disciplines of mechanical engineering, chemical engineering, colloid science, materials science and chemistry. Traditionally, the MRS Spring Meeting serves as a nexus for multidisciplinary interaction and discussion between CMP researchers in both industry and academia. The papers in this book are from the 2007 MRS Spring Meeting and address the fluid and wear mechanics that occur when using CMP tools and pad/slurry consumables, as well as the surface mechanisms required for effective post-CMP cleaning. It also focuses on new successes and challenges in technologies such as electrochemical mechanical planarization (eCMP), three-dimensional integration and advanced CMP process modeling and control strategies.
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