X-Ray Line Profile Analysis in Materials Science

材料科学X射线线形分析法

材料科学基础学科

原   价:
1810.00
售   价:
1448.00
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平台大促 低至8折优惠
发货周期:预计4-6周发货
作      者
出版时间
2014年03月31日
装      帧
精装
ISBN
9781466658523
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页      码
359
开      本
10.00 x 7.01 x 0.81
语      种
英文
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图书简介
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field.X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
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