Digital Circuit Testing

电子技术

售   价:
605.00
发货周期:预计4-6周发货
作      者
出  版 社
出版时间
1991年07月01日
装      帧
精装
ISBN
9780127345802
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页      码
228
开      本
语      种
英文
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图书简介
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector genera
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