Atomic Force Microscopy:Understanding Basic Modes and Advanced Applications

原子力显微镜方法导论:高级应用基本模式

仪器仪表技术

售   价:
1363.00
发货周期:预计3-5周发货
作      者
出  版 社
出版时间
2012年09月07日
装      帧
精装
ISBN
9780470638828
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页      码
496
语      种
英文
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图书简介
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.
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Harvard Library
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