Particles on Surfaces:Detection: Adhesion, and Removal

化学史

售   价:
2080.00
发货周期:预计5-7周发货
作      者
出  版 社
出版时间
1994年12月16日
装      帧
精装
ISBN
9780824795351
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页      码
440
开      本
8-1/2 x 11
语      种
英文
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图书简介
This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.
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