BREAKDOWN PHENOMENA IN SEMICONDUCTORS AND SEMICONDUCTOR DEVICES(SELECTED TOPICS IN ELECTRONICS AND SYSTEMS)

半导体与半导体器件中的击穿现象

电子技术

原   价:
1440.00
售   价:
1080.00
发货周期:预计3-5周发货
作      者
出  版 社
出版时间
2005年09月08日
装      帧
精装
ISBN
9789812563958
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页      码
224
语      种
英文
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图书简介
Impact ionization, avalanche and breakdown phenomena form the basis of many very interesting and important semiconductor devices, such as avalanche photodiodes, avalanche transistors, suppressors, sharpening diodes (diodes with delayed breakdown), as well as IMPATT and TRAPATT diodes. In order to provide maximal speed and power, many semiconductor devices must operate under or very close to breakdown conditions. Consequently, an acquaintance with breakdown phenomena is essential for scientists or engineers dealing with semiconduct
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