Defects in SiO2 and Related Dielectrics

材料表面与界面

售   价:
1768.00
作      者
出  版 社
出版时间
2000年12月15日
装      帧
精装
ISBN
9780792366850
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页      码
624
语      种
英语
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图书简介
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
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